Substrate Roughness and Tilt Angle Dependence of Sum-Frequency Generation Odd–Even Effects in Self-Assembled Monolayers-Reference-Cited by-同舟云学术

Substrate Roughness and Tilt Angle Dependence of Sum-Frequency Generation Odd–Even Effects in Self-Assembled Monolayers

Author:

Du Chuanshen¹²,Andino Richard S.³,Rotondaro Matthew C.³^ORCID,Devlin Shane W.³,Erramilli Shyamsunder⁴,Ziegler Lawrence D.³,Thuo Martin M.¹²^ORCID

Affiliation:

1. Department of Materials Science and Engineering, Iowa State University, Ames, Iowa 50011, United States

2. Micro-electronic Research Center, Iowa State University, Ames, Iowa 50011, United States

3. Department of Chemistry and the Photonics Center, Boston University, Boston, Massachusetts 02215, United States

4. Department of Physics and the Photonics Center, Boston University, Boston, Massachusetts 02215, United States

Funder

Air Force Office of Scientific Research

Boston University

Iowa State University

National Science Foundation

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

Reference54 articles.

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