Soft X-ray Induced Radiation Damage in Dip-and-Pull Photon Absorption and Photoelectron Emission Experiments-Reference-Cited by-同舟云学术

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Soft X-ray Induced Radiation Damage in Dip-and-Pull Photon Absorption and Photoelectron Emission Experiments

Published:2024-08-20 Issue:34 Volume:128 Page:14381-14387
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Cheng Shang-Hong¹,Chang Chien-Hung²,Velasco-Velez Juan-Jesus³⁴^ORCID,Liu Bo-Hong¹⁵^ORCID

Affiliation:

1. Scientific Research Division, National Synchrotron Radiation Research Center, 300092 Hsinchu, Taiwan

2. Experimental Facility Division, National Synchrotron Radiation Research Center, 300092 Hsinchu, Taiwan

3. Department of Heterogeneous Reactions, Max Planck Institute for Chemical Energy Conversion, 45470 Mülheim an der Ruhr, Germany

4. Experiments Division, ALBA Synchrotron Light Source, Cerdanyola del Vallés, Barcelona 08290, Spain

5. Chemical Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States

Funder

Basic Energy Sciences

National Synchrotron Radiation Research Center

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.4c01067

Reference32 articles.

1. K- and L-edge X-ray absorption spectroscopy (XAS) and resonant inelastic X-ray scattering (RIXS) determination of differential orbital covalency (DOC) of transition metal sites

2. In situ investigation of electrochemical devices using ambient pressure photoelectron spectroscopy

3. In situ soft X-ray absorption spectroscopy investigation of electrochemical corrosion of copper in aqueous NaHCO3 solution

4. Perspective—Outlook on Operando Photoelectron and Absorption Spectroscopy to Probe Catalysts at the Solid-Liquid Electrochemical Interface

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