Defect Identification of Nitrogen-Doped Graphene on Pt (111) Using Atomic Force Microscopy and Scanning Tunneling Microscopy-Reference-Cited by-同舟云学术

Defect Identification of Nitrogen-Doped Graphene on Pt (111) Using Atomic Force Microscopy and Scanning Tunneling Microscopy

Published:2023-10-16 Issue:42 Volume:127 Page:20742-20748
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Kang Hyunmin¹,Seo Jeong Ah²³,Yoon Taegeun¹,Cha Yongtae⁴,Park Jiwon⁵,Shin Bong Gyu¹⁶,Heinrich Andreas J.²³^ORCID,Kim Hyo Won⁷^ORCID,Chae Jungseok²⁸,Song Young Jae¹⁶⁹^ORCID

Affiliation:

1. SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon 16419, Republic of Korea

2. Center for Quantum Nanoscience, Institute for Basic Science (IBS), Seoul 03760, Republic of Korea

3. Department of Physics, Ewha Womans University, Seoul 03760, Republic of South Korea

4. Department of Chemical Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea

5. Department of Chemistry, Sungkyunkwan University, Suwon 16419, Republic of Korea

6. Department of Nano Science and Technology, Sungkyunkwan University, Suwon 16419, Republic of Korea

7. Samsung Advanced Institute of Technology, Suwon 16678, Korea

8. Ewha Womans University, Seoul 03760, Republic of Korea

9. Department of Nano Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea

Funder

National Research Foundation of Korea

Institute for Basic Science

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.3c04336

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