Molecular Depth Profiling Using a C60 Cluster Beam: The Role of Impact Energy-Reference-Cited by-同舟云学术

Molecular Depth Profiling Using a C60 Cluster Beam: The Role of Impact Energy

Published:2008-09-27 Issue:42 Volume:112 Page:16550-16555
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Wucher Andreas¹,Cheng Juan¹,Winograd Nicholas¹

Affiliation:

1. Department of Chemistry, Pennsylvania State University, 104 Chemistry Building, University Park, Pennsylvania 16802, and Fachbereich Physik, Universität Duisburg-Essen, 47048 Duisburg, Germany

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp8049763

Reference37 articles.

1. The Magic of Cluster SIMS

2. Wucher, A.Appl. Surf. Sci.2006.

3. Molecular ion imaging and dynamic secondary-ion mass spectrometry of organic compounds

4. Molecular depth profiling of multi-layer systems with cluster ion sources

5. Molecular Depth Profiling with Cluster Ion Beams

Cited by 35 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Physico-chemical characterization of polyimide passivation layers for high power electronics applications;Applied Surface Science;2024-10

2. International Standardization of S-SIMS Quantitative Analysis of Binary Organic Mixtures with Relative Sensitivity Factor Method;Journal of Surface Analysis;2021

3. Intuitive Model of Surface Modification Induced by Cluster Ion Beams;Analytical Chemistry;2020-04-21

4. Metal–Organic Frameworks with Hexakis(4-carboxyphenyl)benzene: Extensions to Reticular Chemistry and Introducing Foldable Nets;Journal of the American Chemical Society;2020-04-21

5. Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2+ cosputtering;The Analyst;2016