Nanorheological Mapping of Rubbers by Atomic Force Microscopy-Reference-Cited by-同舟云学术

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Nanorheological Mapping of Rubbers by Atomic Force Microscopy

Published:2013-02-22 Issue:5 Volume:46 Page:1916-1922
ISSN:0024-9297
Container-title:Macromolecules
language:en
Short-container-title:Macromolecules

Author:

Igarashi Takaaki¹²³,Fujinami So²,Nishi Toshio⁴,Asao Naoki²³,Nakajima and Ken²

Affiliation:

1. Bridgestone Corporation, Tokyo, Japan

2. WPI Advanced Institute for Materials Research, Tohoku University, Sendai, Japan

3. Department of Chemistry, Graduate School of Science, Tohoku University, Sendai, Japan

4. International Division, Tokyo Institute of Technology, Tokyo, Japan

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Inorganic Chemistry,Polymers and Plastics,Organic Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ma302616a

Reference24 articles.

1. Atomic Force Microscope

2. The Temperature Dependence of Relaxation Mechanisms in Amorphous Polymers and Other Glass-forming Liquids

3. Force Microscopy Study of Friction and Elastic Compliance of Phase-Separated Organic Thin Films

4. Friction measurements on phase-separated thin films with a modified atomic force microscope

5. Surface Molecular Motion of the Monodisperse Polystyrene Films

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