Scanning Tunneling Measurements in Membrane-Based Nanostructures: Spatially-Resolved Quantum State Analysis in Postprocessed Epitaxial Systems for Optoelectronic Applications-Reference-Cited by-同舟云学术

Scanning Tunneling Measurements in Membrane-Based Nanostructures: Spatially-Resolved Quantum State Analysis in Postprocessed Epitaxial Systems for Optoelectronic Applications

Published:2019-06-24 Issue:7 Volume:2 Page:4655-4664
ISSN:2574-0970
Container-title:ACS Applied Nano Materials
language:en
Short-container-title:ACS Appl. Nano Mater.

Author:

Rosa Barbara L. T.¹,Parra-Murillo Carlos A.²,Chagas Thais¹³,Garcia Junior Ailton J.⁴,Guimarães Paulo S. S.¹,Deneke Ch.⁴⁵^ORCID,Magalhães-Paniago Rogerio¹,Malachias Angelo¹^ORCID

Affiliation:

1. Departamento de Física, Universidade Federal de Minas Gerais, 31270-901 Belo Horizonte, Minas Gerais, Brazil

2. Departamento de Fisica, Universidad Del Valle, A. A. 25360, Cali, Colombia

3. Department Physik, Universität Siegen, Walter-Flex-Straße 3, 57072 Siegen, Germany

4. Laboratorio Nacional de Nanotecnologia (LNNano), Centro Nacional de Pesquisa em Energia e Materiais (CNPEM), 13083-970 Campinas, São Paulo, Brazil

5. Instituto de Física Gleb Wataghin, Universidade Estadual de Campinas, Unicamp, 13083-859 Campinas, São Paulo, Brazil

Funder

Funda??o de Amparo ? Pesquisa do Estado de Minas Gerais

Conselho Nacional de Desenvolvimento Cient?fico e Tecnol?gico

Funda??o de Amparo ? Pesquisa do Estado de S?o Paulo

Coordena??o de Aperfei?oamento de Pessoal de N?vel Superior

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsanm.9b01124

Reference64 articles.

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4. Resistive switching in optoelectronic III-V materials based on deep traps

5. Size-Dependent Energy Levels of InSb Quantum Dots Measured by Scanning Tunneling Spectroscopy

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