Subject
General Physics and Astronomy,General Engineering,General Mathematics
Reference33 articles.
1. Allen P. N. 1994 The quantification of SIMS depth profiles by maximum entropy reconstruction. Ph.D. thesis University of Warwick.
2. SIMS Profile quantification by maximum entropy deconvolution
3. The depth resolution of sputter profiling
4. Profile distortion in SIMS
5. Briggs D. 1992 In Practical surface analysis (ed. D. Briggs & M. P. Seah) vol. II ch. 7. Chichester: Wiley.
Cited by
17 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献