Qualitative Prediction of Conduction Band Valley Profile in Silicon Thin Films from Bulk Properties by Density Functional k · p Perturbation Theory
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Published:2009-12-01
Issue:12
Volume:6
Page:2559-2566
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ISSN:1546-1955
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Container-title:Journal of Computational and Theoretical Nanoscience
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language:en
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Short-container-title:Jnl of Comp & Theo Nano
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Computational Mathematics,Condensed Matter Physics,General Materials Science,General Chemistry