Effects of Thin-Film Thickness on Sensing Properties of SnO2-Based Gas Sensors for the Detection of H2S Gas at ppm Levels

Author:

Jo Seong Bin1,Kim Hyun Ji2,Ahn Joong Hee3,Hwang Byung Wook4,Huh Jeung Soo5,Ragupathy Dhanusuraman6,Lee Soo Chool1,Kim Jae Chang2

Affiliation:

1. Research Institute of Advanced Energy Technology, Kyungpook National University Daegu 41566, Republic of Korea

2. Department of Chemical Engineering, Kyungpook National University, Daegu 41566, Republic of Korea

3. Greenpia Technology Inc., Seoul 06258, Republic of Korea

4. Korea Institute of Energy Research, Daejeon 34129, Republic of Korea

5. Department of Materials Science and Metallurgy, Kyungpook National University, Daegu 41566, Republic of Korea

6. Department of Chemistry, National Institute of Technology Puducherry Karaikal 609609, India

Abstract

SnO2 thin-film gas sensors were easily created using the ion sputtering technique. The as-deposited SnO2 thin films consist of a tetragonal SnO2 phase and densely packed nanosized grains with diameters of approximately 20−80 nm, which are separated by microcracks. The as-deposited SnO2 thin film is well crystallized, with a dense columnar nanostructure grown directly onto the alumina material and the Pt electrodes. The grain size and thickness of SnO2 thin films are easily controlled by varying the sputtering time of the ion coater. The responses of the SnO2 thin-film sensors decrease as the SnO2 film thickness is increased, indicating that a negative association exists between the sensor response and the SnO2 film thickness due to gas diffusion from the surface. The SnO2 thin-film sensor, which was created by ion sputtering for 10 min, shows an excellent sensor response (Ra/Rg where Ra is the electric resistance under air and Rg is the electric resistance under the test gas) for detecting 1 ppm H2S at 350°C.

Publisher

American Scientific Publishers

Subject

Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3