Impact of Temperature and Fixed Oxide Charge Variation on Performance of Gate-on-Source/Channel SOI TFET and Its Circuit Application
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Published:2018-11-01
Issue:11
Volume:13
Page:1630-1640
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ISSN:1555-130X
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Container-title:Journal of Nanoelectronics and Optoelectronics
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language:en
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Short-container-title:Journal of Nanoelectronics and Optoelectronics
Author:
Kr. Mitra Suman,Bhowmick Brinda
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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