Morphology, Opto-Electronic and Dielectric Properties of Vacuum Sublimed CuPc Based Thin Films

Abstract

AC transport properties and dielectric response of sandwich geometry (Ag/CuPc/Ag) of CuPc(CuPc) thin films deposited using thermal evaporation technique have been studied within frequency range 1 Hz–10 KHz and in temperature range 303–383 K. Scanning electron microscope (SEM) investigations of these films reveal fiber like morphology. Crystalline natures of CuPc films have been characterized using X-ray diffraction for different temperatures. The molecular orientations in films for different substrate temperatures have been confirmed by Raman spectroscopy. The optical band gaps calculated from the UV–Visible absorption spectra is found to lie in the range 3.01–3.15 eV. Electrical conductivity of CuPc films increases with increase of temperature. The hole mobility values of CuPc films at different temperatures have been calculated using negative differential susceptance (–ΔB) technique. Both capacitance and dielectric constant have been found to decrease with the increase of frequency and temperature.