Estimation of AFM Tip Shape and Status in Linewidth and Profile Measurement-Reference-Cited by-同舟云学术

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Estimation of AFM Tip Shape and Status in Linewidth and Profile Measurement

Published:2011-12-01 Issue:12 Volume:11 Page:11041-11044
ISSN:1533-4880
Container-title:Journal of Nanoscience and Nanotechnology
language:en
Short-container-title:j nanosci nanotechnol

Author:

Han Guoqiang,Jiang Zhuangde,Jing Weixuan,Prewett Philip D.,Jiang Kyle

Publisher

American Scientific Publishers

Subject

Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Determination of the radii of coated and uncoated silicon AFM sharp tips using a height calibration standard grating and a nonlinear regression function;Beilstein Journal of Nanotechnology;2023-12-15

2. Molecular Recognition of Proteins through Quantitative Force Maps at Single Molecule Level;Biomolecules;2022-04-18

3. Reconstruction of atomic force microscopy image using compressed sensing;Micron;2018-02

4. Analysis of humidity-dependent adhesion between a probe tip and a surface;Particuology;2017-08

5. Nanostructural and Nanomechanical Responses of Collagen Fibrils in the Collagenase-Induced Achilles Tendinitis Rat Model;Journal of Nanoscience and Nanotechnology;2013-11-01

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