Multiscale Simulation Analysis for Ring Patterned Void Defects in Silicon Mono Crystal
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Published:2013-08-01
Issue:8
Volume:10
Page:1762-1766
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ISSN:1546-1955
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Container-title:Journal of Computational and Theoretical Nanoscience
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language:en
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Short-container-title:Jnl of Comp & Theo Nano
Author:
Lee Sang Hun,Kang Jeong Won
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Computational Mathematics,Condensed Matter Physics,General Materials Science,General Chemistry