Analysis of the Impact of Variations on Signal Electro-Migration and Optimization of Interconnects in FinFET Designs
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Published:2016-05-01
Issue:5
Volume:16
Page:4684-4691
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ISSN:1533-4880
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Container-title:Journal of Nanoscience and Nanotechnology
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language:en
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Short-container-title:j nanosci nanotechnol
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering