Extraction of Distance Between Interface Trap and Oxide Trap from Random Telegraph Noise in Gate-Induced Drain Leakage
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Published:2016-05-01
Issue:5
Volume:16
Page:5247-5251
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ISSN:1533-4880
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Container-title:Journal of Nanoscience and Nanotechnology
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language:en
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Short-container-title:j nanosci nanotechnol
Author:
Seo Youngsoo,Yoo Sungwon,Shin Joonha,Kim Hyunsoo,Kim Hyunsuk,Jeon Sangbin,Shin Hyungcheol
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering