X-ray diffraction methods for structural diagnostics of materials: progress and achievements

Abstract

Abstract The development of X-ray diffractometry at the turn of the 21st century is presented. The review covers instrumentation development for structural studies based on the use of both standard continuously radiating X-ray generators and state-of-the-art sources of ultrashort and ultra-bright X-ray pulses. The latter technique enables investigation of the structural dynamics of condensed matter in a 4D space–time continuum with a resolution reaching a tenth of a femtosecond. New engineering approaches to enhancing the sensitivity, accuracy, and efficiency of X-ray diffraction experiments are discussed, including new and promising X-rays sources, reflective collimating and focusing X-ray optical devices, and fast low-noise and radiation-resistant position-sensitive X-ray detectors, as well as a new generation of X-ray diffractometers developed based on these elements. The presentation is focused on modern engineering solutions that enable academic and applied-research laboratories to perform X-ray diffraction studies on-site, which earlier were only feasible using synchrotron radiation sources at international resource sharing centers.