Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7−x thin films

Author:

Martínez O.,Jiménez J.,Chambonnet D.,Belouet C.

Abstract

Superconducting YBa2Cu3O7−x (YBCO) thin films grown by pulser-laser-assisted deposition were studied by micro-Raman spectroscopy. This technique was used to estimate the epitaxial quality of the films in terms of the presence of c-axis- and a-axis-oriented areas. The advantage of micro-Raman spectroscopy is its high lateral resolution, and this was used to study the homogeneity of the films at submicrometric level. Local structural changes from a large number of intergrain regions were revealed by changes of the Raman parameters. For example, the aggregation of a-axis-oriented grains formed needle-shaped macrograins. Micro-Raman measurements suggest that these grains were seeded at large-angle grain boundaries in c-axis-oriented areas.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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