A Study of Free- and Bound-Exciton Recombination in Device Quality Diamond-Reference-Cited by-同舟云学术

A Study of Free- and Bound-Exciton Recombination in Device Quality Diamond

Published:1995 Issue: Volume:416 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Sharp S. J.,Collins A. T.

Abstract

ABSTRACTA cathodoluminescence (CL) study of free- and bound-exciton recombination in high purity high pressure high temperature (HPHT) synthetic diamond is presented, including temperature dependence measurements of the free-exciton intensity and luminescence decaytime. The results are compared with those from device quality diamond produced using the chemical vapour deposition (CVD) process.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference8 articles.

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