Author:
Bai H.Y.,Wang W.H.,Zhang Y.,Chen H.,Wang W.K.
Abstract
It was found that the modulation wavelength and average composition of multilayers are related to the position, intensity, and diffraction order of x-ray modulation peaks for multilayers. The relation between the characteristics of the modulation peaks in different as-deposited multilayers and their interdiffusion capability is also discussed.
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference6 articles.
1. An X‐Ray Method of Determining Rates of Diffusion in the Solid State
2. DIFFUSION
3. X-Ray Spectroscopy
4. 6. Bai H. Y. , Zhang Y. , Chen H. , and Wang W. K. , J. Mater. Sci. Lett, (in press).
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