Diamond-Like Carbon Film Propertffis From Optical and Electrical Measurements
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Published:1996
Issue:
Volume:446
Page:
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ISSN:0272-9172
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Container-title:MRS Proceedings
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language:en
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Short-container-title:MRS Proc.
Author:
Dalton A.,Kosel P.B.,Monreal R.,Frees-carr S.,Weimer J.,Wu R.L.C.,Lanter W.
Abstract
AbstractHigh resistivity diamond-like carbon films have been grown on a variety of substrate surfaces using RF generated high-current hydrocarbon ion beams at low pressures. Stable films have been obtained in the thickness range of 0.3 to 1.2 �m with resistivities exceeding 1013 O-cm. These films have been deposited on smooth surfaces such as oxidized silicon, glass, quartz, aluminum and plastics. The films have smooth surfaces, great hardness and moderate dielectric constant (2.2 to 3.5). Optical absorption measurements show that these films are highly absorbing in the ultraviolet region of the spectrum and in the visible range their absorption coefficients exceed 104 cm-1 and the refractive indices fall in the range 1.75 to 2.17 at 632.8 nm.
Publisher
Springer Science and Business Media LLC
Subject
General Engineering
Reference2 articles.
1. Electrochemical Society Proceedings;Kosel;"Diamond-Like Carbon Films for High Temperature Electronic Applications",1995
2. Proc. MRS Symposium A;Wu;"Uniform and large area deposition of diamond-like carbon using RF source ion beams",1995
Cited by
1 articles.
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