The Formation and Annealing of Amorphous Layers of Al2O3

Author:

Farlow G. C.,Sklad P. S.,White C. W.,McHargue C. J.,Appleton B. R.

Abstract

AbstractThe critical dose for formation of an amorphous layer of Al2O3 by ion irradiation at 77 K has been determined. It is found to lie between 2 and 3 × 1015/cm2 if the sample is irradiated near the <0001> axis of the substrate and is found to lie in the neighborhood of 2 × 1016/cm2 if the irradiation is near the <1210> axis. The amorphous layers are found to recrystallize epitaxially if annealed at 1190 degrees C and to form a metastable microstructure upon annealing at 800 degrees C.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Ion-beam induced effects at 15K in α-Al2O3 of different orientations;Journal of Applied Physics;2006-06-15

2. Crystallographic orientation dependence of radiation damage in Ar+ implanted YSZ and MgO single crystals;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-11

3. Effect of crystal orientation on damage accumulation and post-implantation annealing for iron implantation into sapphire;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-01

4. Radiation damage and doping by implantation of Ti or Pd ions into TiO2 layers on Ti;Journal of Electroanalytical Chemistry and Interfacial Electrochemistry;1991-02

5. Repassivation and ion migration in Pd-implanted TiO2layers on Ti;Radiation Effects and Defects in Solids;1990-08

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