Author:
Conley John F.,Lenahan P.M.,Evans H.L.,Lowry R.K.,Morthorst T.J.
Abstract
ABSTRACTWe combine electron spin resonance measurements with vacuum ultraviolet, ultraviolet, and corona bias charge injection schemes to examine the properties and charge trapping roles of three E′ variants in conventionally processed thermally grown thin film SiO2 on Si.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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