Electric Transport Properties of a NiTi Shape Memory Alloy Under Applied Stress.

Abstract

AbstractIt is well known that mechanical properties of Shape Memory Alloys are strongly dependent upon the test temperature (T) respect to transformation temperatures: the stress-strain curves however hinder the true deformation processes acting.Electrical resistance(ER), a physical property sensibly affected by electronic structure modifications, traditionally used to follow the growth of thermal martensite, is here investigated to follow the modifications of a NiTi alloy, in an initial single phase structure, under applied stress. ER measurements are here detected with the aim to distinguish different deformation processes at four test temperatures Ti (i=1,..,4): in martensitic phase,either at T1 <Mf or at T2<As within the hysteresis cycle; in parent phase, either at Af<T3 or at Ms<T4 within the hysteresis cycle, where T2 = T4. Results are examined in comparison with previous obtained data and discussed at the light of imprinted deformation.