1. Hydrogen passivation of point defects in silicon
2. 18Hydrogen could be detected by SIMS in Si samples containing a high concentration of O precipitates. See, Hahn G. Karg D. Schönecker A. , Burgers A. R. Ginige R. and Cherkaoui K. Conf. Rec. of the 31st IEEE Photovoltaic Specialist Conference (IEEE Cat. No. 05CH37608), p. 1035 (2005)
3. G. Hahn A. Schönecker, A. R. Burgers R. Ginige K. Cherkaoui and D. Karg Proc. 20th European Photovoltaic Solar Energy Conf., Barcelona, p. 717 (2005).
4. 32 Weeber A. W. Rieffe H. C. Romijn I. G. Sinke W. C. Soppe W. J. Conf. Rec. of the 31st IEEE Photovoltaic Specialist Conference (IEEE Cat. No. 05CH37608), p. 1043 (2005).
5. 37 Kleekajai S. Wen L. Peng C. Stavola M. Yelundur V. Nakayashiki K. Rohatgi A. and Kalejs J. J. Appl. Phys., submitted.