Uniaxial Stress and Zeeman Measurements on the 943 meV Luminescence Band in Silicon

Author:

Carmo M.C.,Mcguigan K.G.,Henry M.O.,Davies G.,Lightowlers E.C.

Abstract

AbstractThe photoluminescence from silicon lightly doped with copper and rapidly quenched from ~ 1100° C is dominated by a vibronic band with zero--phonon lines (ZPL) in the region of 943 meV. We have studied the effect of external fields on the electronic properties of this band and the results are consistent with the luminescence occurring at a defect with Td symmetry. The Zeeman measurements indicate that the luminescence is due to the recombination of excitons in J = 1, J = 2 states with the normal ordering of these levels reversed. This reversal is explained by the different response of these states to hydrostatic strains, and it is also argued that strain at the defect provides the binding potential for the exciton.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Transition Metals in Silicon;Phonons in Semiconductor Nanostructures;1993

2. Silicon, photoluminescence data on defect spectra;Impurities and Defects in Group IV Elements, IV-IV and III-V Compounds. Part a: Group IV Elements

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