Optical and Dielectric Properties of Eu- and Y-Polytantalate Thin Films

Abstract

ABSTRACTDue to their highly efficient photo-luminescent (PL) characteristics, the physical properties of rare-earth polytantalates, RETa7O19(RE=Eu and Y) were further studied. AFM, SEM, HRTEM, x-ray reflectometry, spectroscopic ellipsometry and standard dielectric testing were used to determine film thickness, roughness, index of refraction, band-gap, dielectric constant, leakage current and breakdown field for as-deposited (amorphous) and post-annealed (crystalline) films. Structural and morphological properties of the Film/SiO2/Si interfaces were also examined.