Growth, Characterization and Physics of Antiferromagnetic Thin Films and Superlaptices-Reference-Cited by-同舟云学术

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Growth, Characterization and Physics of Antiferromagnetic Thin Films and Superlaptices

Published:1991-01 Issue: Volume:221 Page:
ISSN:1946-4274
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Jaccarino V.,King A.R.,Lederman D.,Lui M.,Ramos C.A.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference21 articles.

1. Capacitance measurement of magnetic specific heat

2. Critical behavior of epitaxial antiferromagnetic insulators: Interdigital capacitance measurement of magnetic specific heat ofFeF2thin films

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Epitaxial growth on silicon and characterization of MnF2 and ZnF2 layers with metastable orthorhombic structure;Journal of Applied Physics;2005-07

2. Structural and magnetic properties of FeF2(001)/ZnF2(001) and FeF2(110)/ZnF2(110) superlattices;Journal of Physics: Condensed Matter;2003-02-18

3. Magnetic phase transition of FeF2/ZnF2 superlattices;Journal of Magnetism and Magnetic Materials;2002-02

4. Exchange bias in Fe[sub x]Zn[sub 1−x]F[sub 2]/Co bilayers;Journal of Applied Physics;2002

5. Growth study of epitaxial FexZn1−xF2 thin films;Journal of Materials Research;2001-06

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