Author:
Yeh T.,Wang G.,Lin J. C.,Sivertsen J. M.
Abstract
AbstractCoCrTa thin films with c-axis predominatly oriented perpendicular to the plane of the film were obtained by sputter deposition on thin tantalum nitride underlayers with −75 volts substrate bias applied during the deposition of the film. The relationship between the distribution of c-axes preferred crystal orientation and magnetization reversal properties of the sputtered CoCrTa films was investigated. Higher coercivities are obtained for CoCrTa films having a more random crystal orientation distribution of hcp c-axes in polycrystal films, while lower coercivity is obtained for the highly oriented films. Such behavior may be attributed to the form of the induced local energy fluctuations associated with the crystal orientation distributions.
Publisher
Springer Science and Business Media LLC