UV Sensor Based on Surface Acoustic Waves in ZnO/Fused Silica

Author:

Caliendo Cinzia1ORCID,Benetti Massimiliano2ORCID,Cannatà Domenico2ORCID,Buzzin Alessio3ORCID,Grossi Francesca3,Verona Enrico1ORCID,de Cesare Giampiero3ORCID

Affiliation:

1. Institute for Photonics and Nanotechnology (IFN), Unit of Rome, National Research Council (CNR), Via del Fosso del Cavaliere 100, 00133 Rome, Italy

2. Institute for Microelectronics and Microsystems (IMM), Unit of Rome, National Research Council (CNR), Via del Fosso del Cavaliere 100, 00133 Rome, Italy

3. Department of Information Engineering, Electronics and Telecommunications, Sapienza University of Rome, Via Eudossiana 18, 00184 Rome, Italy

Abstract

Zinc oxide (ZnO) thin films have been grown by radio frequency sputtering technique on fused silica substrates. Optical and morphological characteristics of as-grown ZnO samples were measured by various techniques; an X-ray diffraction spectrum showed that the films exhibited hexagonal wurtzite structure and were c-axis-oriented normal to the substrate surface. Scanning electron microscopy images showed the dense columnar structure of the ZnO layers, and light absorption measurements allowed us to estimate the penetration depth of the optical radiation in the 200 to 480 nm wavelength range and the ZnO band-gap. ZnO layers were used as a basic material for surface acoustic wave (SAW) delay lines consisting of two Al interdigitated transducers (IDTs) photolithographically implemented on the surface of the piezoelectric layer. The Rayleigh wave propagation characteristics were tested in darkness and under incident UV light illumination from the top surface of the ZnO layer and from the fused silica/ZnO interface. The sensor response, i.e., the wave velocity shift due to the acoustoelectric interaction between the photogenerated charge carriers and the electric potential associated with the acoustic wave, was measured for different UV power densities. The reversibility and repeatability of the sensor responses were assessed. The time response of the UV sensor showed a rise time and a recovery time of about 10 and 13 s, respectively, and a sensitivity of about 318 and 341 ppm/(mW/cm2) for top and bottom illumination, respectively. The ZnO/fused silica-based SAW UV sensors can be interrogated across the fused silica substrate thanks to its optical transparency in the UV range. The backlighting interrogation can find applications in harsh environments, as it prevents the sensing photoconductive layer from aggressive environmental effects or from any damage caused by cleaning the surface from dust which could deteriorate the sensor’s performance. Moreover, since the SAW sensors, by their operating principle, are suitable for wireless reading via radio signals, the ZnO/fused-silica-based sensors have the potential to be the first choice for UV sensing in harsh environments.

Funder

DRUIDA Project

Lazio Innova

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Photoisomerization-induced LMR shift for UV radiation detection;Sensors and Actuators A: Physical;2024-02

2. ZnO based Back- and Front-Illuminated Photoresistor for UV Sensing Applications;2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI);2023-06-08

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