Machine Learning-Enabled Quantitative Analysis of Optically Obscure Scratches on Nickel-Plated Additively Manufactured (AM) Samples

Author:

Mengesha Betelhiem N.1,Grizzle Andrew C.1,Demisse Wondwosen1,Klein Kate L.1ORCID,Elliott Amy2ORCID,Tyagi Pawan1ORCID

Affiliation:

1. Mechanical Engineering, University of the District of Columbia, Washington, DC 20008, USA

2. Manufacturing Demonstration Facility, 2350 Cherahala Boulevard, Knoxville, TN 37932, USA

Abstract

Additively manufactured metal components often have rough and uneven surfaces, necessitating post-processing and surface polishing. Hardness is a critical characteristic that affects overall component properties, including wear. This study employed K-means unsupervised machine learning to explore the relationship between the relative surface hardness and scratch width of electroless nickel plating on additively manufactured composite components. The Taguchi design of experiment (TDOE) L9 orthogonal array facilitated experimentation with various factors and levels. Initially, a digital light microscope was used for 3D surface mapping and scratch width quantification. However, the microscope struggled with the reflections from the shiny Ni-plating and scatter from small scratches. To overcome this, a scanning electron microscope (SEM) generated grayscale images and 3D height maps of the scratched Ni-plating, thus enabling the precise characterization of scratch widths. Optical identification of the scratch regions and quantification were accomplished using Python code with a K-means machine-learning clustering algorithm. The TDOE yielded distinct Ni-plating hardness levels for the nine samples, while an increased scratch force showed a non-linear impact on scratch widths. The enhanced surface quality resulting from Ni coatings will have significant implications in various industrial applications, and it will play a pivotal role in future metal and alloy surface engineering.

Funder

National Science Foundation-CREST Award

Department of Energy/National Nuclear Security Agency

NASA

US Department of Energy

Publisher

MDPI AG

Subject

General Materials Science

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