Yield Prediction of Winter Wheat at Different Growth Stages Based on Machine Learning

Author:

Lou Zhengfang1,Lu Xiaoping1,Li Siyi1

Affiliation:

1. Key Laboratory of Spatio-Temporal Information and Ecological Restoration of Mines of Natural Resources of the People’s Republic of China, Henan Polytechnic University, Jiaozuo 454003, China

Abstract

Accurate and timely prediction of crop yields is crucial for ensuring food security and promoting sustainable agricultural practices. This study developed a winter wheat yield prediction model using machine learning techniques, incorporating remote sensing data and statistical yield records from Henan Province, China. The core of the model is an ensemble voting regressor, which integrates ridge regression, gradient boosting, and random forest algorithms. This study optimized the hyperparameters of the ensemble voting regressor and conducted an in-depth comparison of its yield prediction performance with that of other mainstream machine learning models, assessing the impact of key hyperparameters on model accuracy. This study also explored the potential of yield prediction at different growth stages and its application in yield spatialization. The results demonstrate that the ensemble voting regressor performed exceptionally well throughout the entire growth period, with an R2 of 0.90, an RMSE of 439.21 kg/ha, and an MAE of 351.28 kg/ha. Notably, during the heading stage, the model’s prediction performance was particularly impressive, with an R2 of 0.81, an RMSE of 590.04 kg/ha, and an MAE of 478.38 kg/ha, surpassing models developed for other growth stages. Additionally, by establishing a yield spatialization model, this study mapped county-level yield predictions to the pixel level, visually illustrating the spatial differences in land productivity. These findings provide reliable technical support for winter wheat yield prediction and valuable references for crop yield estimation in precision agriculture.

Funder

National Key Research and Development Plan of China

Publisher

MDPI AG

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