An Improved High-Resistance Fault Detection Method in DC Microgrid Based on Orthogonal Wavelet Decomposition

Abstract

High-resistance faults in direct current (DC) microgrids are small and thus difficult to detect. Such faults may be “invisible” in that grid operation continues for a considerable time, which damages the grid. It is essential to detect and remove high-resistance faults; we present a detection method herein. First, the transient DC current during the fault is subjected to hierarchical wavelet decomposition to identify high-resistance faults accurately and sensitively; the wavelet coefficients are detected using the singular value decomposition (SVD) method. The SVD valve can denoise the dc microgrid fault current, which eliminates the influence of converter switching frequency and background noise effectively. Power system computer-aided design (PSCAD)/electromagnetic transients including direct current (EMTDC)-based simulations showed that our method successfully identified high-resistance faults.