Investigation of the Interfacial Reactions between the CoCuFeNi High Entropy Alloy and Sn Solder

Author:

Chiang Tzu-Yang1ORCID,Chang Yong-Chi1,Wang Chao-Hong2ORCID,Laksono Andromeda Dwi1ORCID,Yen Yee-Wen1ORCID

Affiliation:

1. Department of Materials Science and Engineering, National Taiwan University of Science and Technology, Taipei 10672, Taiwan

2. Department of Chemical Engineering, National Chung Cheng University, Chiayi 621301, Taiwan

Abstract

The CoCuFeNi high entropy alloy (HEA) has excellent electrical, thermal, and mechanical properties. In electronic packaging technology, Sn is the major element of lead-free solders. In this study, we used the CoCuFeNi HEA as the substrate and Sn as the solder and investigated the liquid/solid interfacial reactions of the Sn/CoCuFeNi system at 300, 375, and 450 °C for 30, 60, 100, 150, 360, and 480 min. The results indicated that the (Fe, Co)Sn2 phase was formed in the Sn/CoCuFeNi couples for all various reaction temperatures and at different durations. Additionally, the (Co, Ni)Sn2 phase was precipitated at the solder side and near the (Fe, Co)Sn2 phase when the reaction time increased. The thickness of the (Fe, Co)Sn2 phase increased with the increase in reaction temperature and time, and it was proportional to the square root of the reaction time. Overall, our results showed that the growth mechanism of the (Fe, Co)Sn2 phase was diffusion-controlled in the Sn/CoCuFeNi couples.

Funder

National Science and Technology Council, Taiwan

Publisher

MDPI AG

Subject

General Materials Science,Metals and Alloys

Reference15 articles.

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3