Segmentation and Classification of Zn-Al-Mg-Sn SEM BSE Microstructure

Author:

Kuchar Daniel,Gogola PeterORCID,Gabalcova ZuzanaORCID,Nemethova Andrea,Nemeth Martin

Abstract

The microstructure of materials is shaped not only by their chemical composition, but also by the thermomechanical processes used during the processing of a specific piece. The correct interpretation of the microstructure gives a rich source of information. This consists of several related steps, such as segmentation. Successful segmentation enables the qualitative as well as quantitative analysis of the individual microstructure components. The current paper deals with the segmentation and classification of four basic microstructure components of the Zn-Al-Mg-Sn alloy system. This is attempted with the help of several image processing techniques, where thresholding is the main one used. The investigated samples are the cast and annealed Zn-Al-Mg-Sn alloy bulks. The input data for this analysis are the SEM BSE images. These were taken for all alloys with a varying Sn content, covering a significant area of each investigated sample at different zoom levels. A semiautomatic algorithm running under Matlab is introduced. It addresses several tasks, such as preprocessing, noise filtering and decision methods. For the individual procedures, the time requirements for their execution are also indicated.

Funder

Modernization and new possibilities of online education in the field of logical control systems and process visualization

Slovak Research and Development Agency

Grant Agency VEGA of the Slovak Ministry of Education, Research, Science and Sport

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

Reference59 articles.

1. Ul-Hamid, A. (2018). A Beginners’ Guide to Scanning Electron Microscopy, Springer Nature.

2. Goldstein, J.I., and Newbury, D.E. (2018). Scanning Electron Microscopy and X-ray Microanalysis, Springer Science + Business Media LLC. [4th ed.].

3. Amelinckx, S., and van Dyck, D. (1997). Electron Microscopy Principles and Fundamentals, VCH Verlagsgesellschaft mbH.

4. Bowen, D.K., and Hall, C.R. (1975). Microscopy of Materials Modern Imaging Methods Using Electron, X-ray and Ion Beams, The MacMillan Press LTD.

5. Dehm, G., and Howe, J.M. (2012). In-Situ Electron Microscopy Applications in Physics, Chemistry and Materials Science, Wiley-VCH Verlag & Co. KGaA.

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