Author:
Yu Bin,Xu Chenggang,Xie Mingxing,Cao Meng,Zhang Jijun,Jiang Yucheng,Wang Linjun
Abstract
CdZnTe (CZT) films were grown by closed space sublimation (CSS) method on (111)-oriented CZT wafers, non-oriented CZT wafers and FTO substrates. The compositional and morphological properties of CZT films on different substrates were characterized by scanning electron microscopy (SEM) and atomic force microscopy (AFM), which indicated that CZT films grown on (111)-oriented CZT wafers had low dislocation density and high Zn composition. X-ray diffraction (XRD) measurements confirmed that CZT films grown on (111)-oriented CZT wafers had the best crystal quality. The I-V and DC photoconductivity measurements indicated that CZT films on (111)-oriented CZT wafer had good carrier transport performance. The energy spectra of CZT films grown on (111)-oriented CZT wafer presented that it had a good response to the nuclear radiation under 241Am.
Subject
Inorganic Chemistry,Condensed Matter Physics,General Materials Science,General Chemical Engineering
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献