A Molecular Dynamics Perspective on the Impacts of Random Rough Surface, Film Thickness, and Substrate Temperature on the Adsorbed Film’s Liquid–Vapor Phase Transition Regime

Author:

Fallahzadeh Rasoul1,Bozzoli Fabio2ORCID,Cattani Luca2ORCID,Pagliarini Luca1ORCID,Naeimabadi Niloofar1,Azam Muhammad Waheed1

Affiliation:

1. Department of Architecture and Engineering, University of Parma, Parco Area delle Science 181/A, 43124 Parma, Italy

2. Department of Engineering for Industrial Systems and Technologies, University of Parma, 43124 Parma, Italy

Abstract

While recent studies have proven an unexpected liquid–vapor phase transition of adsorbed liquid films, a comprehensive description of the mechanisms of different types of phase change regimes over realistic representations of random rough surfaces is absent in the literature. The current comprehensive study investigates the effects of a gold random rough surface, liquid film thickness, and substrate temperature on the liquid–vapor phase change regime of an adsorbed sodium liquid film, considering the evaporator section of a wicked heat pipe (WHP) using a molecular dynamics (MD) simulation. At first, to generate a realistic random rough surface, a new and promising method is proposed that is entirely based on MD simulations. Then, to simulate the evaporator section of a WHP, a unique configuration for eliminating the vapor domain is developed. The simulation results reveal that three distinct regimes, namely, normal evaporation, cluster boiling, and film boiling, could be identified, which are presented on two-dimensional diagrams with the substrate temperature and liquid film thickness as coordinates for the ideally smooth and random rough surfaces. The results also manifest that even though using the random rough surface could lead to different phase transition regimes, the type of regime depends mainly on the substrate temperature and liquid film thickness. Furthermore, this study displays two different modes for normal evaporation. Also, it is shown that the impacts of the liquid film thickness and substrate temperature on the mode of normal evaporation are much more significant than the surface roughness.

Funder

Ministry of University and Research (MUR), Italy, FSE-REACT-EU

Publisher

MDPI AG

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