Abstract
The physical process underlying microscopy imaging suffers from several issues: some of them include the blurring effect due to the Point Spread Function, the presence of Gaussian or Poisson noise, or even a mixture of these two types of perturbation. Among them, auto–fluorescence presents other artifacts in the registered image, and such fluorescence may be an important obstacle in correctly recognizing objects and organisms in the image. For example, particle tracking may suffer from the presence of this kind of perturbation. The objective of this work is to employ Deep Learning techniques, in the form of U-Nets like architectures, for background emission removal. Such fluorescence is modeled by Perlin noise, which reveals to be a suitable candidate for simulating such a phenomenon. The proposed architecture succeeds in removing the fluorescence, and at the same time, it acts as a denoiser for both Gaussian and Poisson noise. The performance of this approach is furthermore assessed on actual microscopy images and by employing the restored images for particle recognition.
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Vision and Pattern Recognition,Radiology, Nuclear Medicine and imaging
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献