Temperature Dependence of Magnetization Dynamics in Co/IrMn and Co/FeMn Exchange Biased Structures

Author:

Dzhun Irina O.1,Gerasimenko Andrey V.2,Ezhov Alexander A.3ORCID,Bezzubov Stanislav I.4ORCID,Rodionova Valeria V.5ORCID,Gritsenko Christina A.5,Chechenin Nikolai G.13

Affiliation:

1. Skobeltsyn Institute of Nuclear Physics, Lomonosov Moscow State University, 1/2 Leninskie Gory, 119991 Moscow, Russia

2. Institute of Chemistry FEB RAS, 159 100-Letiya Vladivostoka Ave., 690022 Vladivostok, Russia

3. Faculty of Physics, Lomonosov Moscow State University, 1/2 Leninskie Gory, 119991 Moscow, Russia

4. Kurnakov Institute of General and Inorganic Chemistry RAS, 31 Leninskii Pr., 119991 Moscow, Russia

5. Research and Education Center “Smart Materials and Biomedical Applications”, Immanuel Kant Baltic Federal University, 6 Gaidara Str., 236041 Kaliningrad, Russia

Abstract

Thin film ferromagnet/antiferromagnet (F/AF) exchange biased structures that are widely used in GMR spin valves are considered nowadays as promising systems for antiferromagnetic spintronic and spin-orbitronic devices. Here, the temperature dependences of magnetization dynamics in Co/IrMn and Co/FeMn F/AF structures are investigated using ferromagnetic resonance (FMR) in comparison to a free Co layer. A strong additional decrease in the resonance field was observed in Co/IrMn with a temperature decrease attributed to the rotatable anisotropy increase, which almost vanished at room temperature. In contrast to Co/IrMn, the contribution of the rotatable anisotropy in Co/FeMn is much weaker, even though it exists at RT, it is negative, and slightly varies with the temperature and resonance field shift in Co/FeMn. This is mainly due to unidirectional exchange anisotropy. FMR linewidth for the free Co layer increases with decreasing temperature and is accompanied with a slow relaxation process, while the additional contribution to FMR line broadening in Co/IrMn and Co/FeMn structures is correlated with variation in the exchange anisotropy. The observed results are discussed based on structural and surface morphology and magnetization reversal characterization using X-ray diffraction, atomic force microscopy, and vibrating sample magnetometry data.

Publisher

MDPI AG

Subject

Materials Chemistry,Chemistry (miscellaneous),Electronic, Optical and Magnetic Materials

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