A Comparison Study on Multilayered Barrier Oxide Structure in Charge Trap Flash for Synaptic Operation

Author:

Kim Minkyung,Park Eunpyo,Kim In Soo,Park Jongkil,Kim Jaewook,Jeong YeonJoo,Lee Suyoun,Kim Inho,Park Jong-Keuk,Seong Tae-Yeon,Kwak Joon YoungORCID

Abstract

A synaptic device that contains weight information between two neurons is one of the essential components in a neuromorphic system, which needs highly linear and symmetric characteristics of weight update. In this study, a charge trap flash (CTF) memory device with a multilayered high-κ barrier oxide structure on the MoS2 channel is proposed. The fabricated device was oxide-engineered on the barrier oxide layers to achieve improved synaptic functions. A comparison study between two fabricated devices with different barrier oxide materials (Al2O3 and SiO2) suggests that a high-κ barrier oxide structure improves the synaptic operations by demonstrating the increased on/off ratio and symmetry of synaptic weight updates due to a better coupling ratio. Lastly, the fabricated device has demonstrated reliable potentiation and depression behaviors and spike-timing-dependent plasticity (STDP) for use in a spiking neural network (SNN) neuromorphic system.

Funder

Korea Institute of Science and Technology

National Research Foundation of Korea

Publisher

MDPI AG

Subject

Inorganic Chemistry,Condensed Matter Physics,General Materials Science,General Chemical Engineering

Reference22 articles.

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