A RRAM-Based True Random Number Generator with 2T1R Architecture for Hardware Security Applications
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Published:2023-06-08
Issue:6
Volume:14
Page:1213
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ISSN:2072-666X
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Container-title:Micromachines
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language:en
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Short-container-title:Micromachines
Author:
Peng Bo1, Wu Qiqiao2, Wang Zhongqiang1, Yang Jianguo34ORCID
Affiliation:
1. Key Laboratory of UV Light-Emitting Materials and Technology of Ministry of Education, Northeast Normal University, Changchun 130024, China 2. School of Microelectronics, University of Science and Technology of China, Hefei 230026, China 3. Key Laboratory of Microelectronic Devices Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China 4. Research Center for Intelligent Computing Hardware, Zhejiang Lab, Hangzhou 311121, China
Abstract
Resistance random access memory (RRAM) based true random number generator (TRNG) has great potential to be applied to hardware security owing to its intrinsic switching variability. Especially the high resistance state (HRS) variation is usually taken as the entropy source of RRAM-based TRNG. However, the small HRS variation of RRAM may be introduced owing to fabrication process fluctuations, which may lead to error bits and be vulnerable to noise interference. In this work, we propose an RRAM-based TRNG with a 2T1R architecture scheme, which can effectively distinguish the resistance values of HRS with an accuracy of 1.5 kΩ. As a result, the error bits can be corrected to a certain extent while the noise is suppressed. Finally, a 2T1R RRAM-based TRNG macro is simulated and verified using the 28 nm CMOS process, which suggests its potential for hardware security applications.
Funder
Major Scientific Research Project of Zhejiang Lab
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Control and Systems Engineering
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