Deep Neural Network with Hilbert–Huang Transform for Smart Fault Detection in Microgrid

Author:

Aqamohammadi Amir Reza1,Niknam Taher1,Shojaeiyan Sattar2,Siano Pierluigi34ORCID,Dehghani Moslem1ORCID

Affiliation:

1. Department of Electrical and Electronics Engineering, Shiraz University of Technology, Shiraz 7155713876, Iran

2. Department of Electrical Engineering, Marvdasht Branch, Islamic Azad University, Marvdasht 7371113119, Iran

3. Department of Management and Innovation Systems, University of Salerno Via Giovanni Paolo II, 132, 84084 Fisciano, Italy

4. Department of Electrical and Electronic Engineering Science, University of Johannesburg, Johannesburg 2006, South Africa

Abstract

The fault detection method (FDM) plays a crucial role in controlling and operating microgrids (MGs), because it allows for systems to rapidly isolate and restore faults. Due to the fact that MGs use inverter-interfaced distributed production, conventional FDMs are no longer appropriate because they are dependent on substantial fault currents. This study presents a smart FDM for MGs based on the Hilbert–Huang transform (HHT) and deep neural networks (DNNs). The suggested layout aims to prepare the fast detection of fault kind, phase, and place data to protect MGs and restore services. The HHT pre-processes the branch current measurements obtained from the protective relays to extract the characteristics, and singular value decomposition (SVD) is used to extract some features from intrinsic mode functions (IMFs) that are obtained from HHT to use as input of DNNs. As part of the fault data development, all the information eventually enters the DNNs. Compared with prior studies, this suggested method provides considerably superior fault-type identification accuracy. It is also possible to determine new fault locations. A detailed assessment analysis of this suggested FDM was conducted on IEEE 34-bus and MG systems to demonstrate its effectiveness. The simulations indicated that the proposed method is effective for detecting precision, computing time, and robustness to measurement uncertainties.

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering

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