PAL-YOLOv8: A Lightweight Algorithm for Insulator Defect Detection

Author:

Zhang Du1ORCID,Cao Kerang2ORCID,Han Kai3,Kim Changsu1ORCID,Jung Hoekyung1ORCID

Affiliation:

1. Department of Computer Science and Engineering, Pai Chai University, 155-40 Baejae-ro, Daejeon 35345, Republic of Korea

2. Key Laboratory of Intelligent Technology of Chemical Process Industry in Liaoning Province, College of Computer Science and Technology, Shenyang University of Chemical Technology, Shenyang 110142, China

3. Department of International Business Administration, Woosong University, 171 Dong daejeon-ro, Daejeon 34606, Republic of Korea

Abstract

To address the challenges of high model complexity and low accuracy in detecting small targets in insulator defect detection using UAV aerial imagery, we propose a lightweight algorithm, PAL-YOLOv8. Firstly, the baseline model, YOLOv8n, is enhanced by incorporating the PKI Block from PKINet to improve the C2f module, effectively reducing the model complexity and enhancing feature extraction capabilities. Secondly, Adown from YOLOv9 is employed in the backbone and neck for downsampling, which retains more feature information while reducing the feature map size, thus improving the detection accuracy. Additionally, Focaler-SIoU is used as the bounding-box regression loss function to improve model performance by focusing on different regression samples. Finally, pruning is applied to the improved model to further reduce its size. The experimental results show that PAL-YOLOv8 achieves an mAP50 of 95.0%, which represents increases of 5.5% and 2.6% over YOLOv8n and YOLOv9t, respectively. Furthermore, GFLOPs is only 3.9, the model size is just 2.7 MB, and the parameter count is only 1.24 × 106.

Funder

Ministry of Education

MSIT (Ministry of Science and ICT), Korea

Publisher

MDPI AG

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