Luminescence Properties of Epitaxial Cu2O Thin Films Electrodeposited on Metallic Substrates and Cu2O Single Crystals

Author:

Trinkler Laima1ORCID,Dai Dajin2,Chang Liuwen23,Chou Mitch Ming-Chi23,Wu Tzu-Ying2,Gabrusenoks Jevgenijs1,Nilova Dace1,Ruska Rihards1,Berzina Baiba1,Nedzinskas Ramunas14

Affiliation:

1. Institute of Solid State Physics, University of Latvia, Kengaraga St. 8, LV-1063 Riga, Latvia

2. Department of Materials and Optoelectronic Science, National Sun Yat-sen University, Kaohsiung 80424, Taiwan

3. Center of Crystal Research, National Sun Yat-sen University, Kaohsiung 80424, Taiwan

4. Center for Physical Sciences and Technology, Saulėtekio Ave. 3, LT-10257 Vilnius, Lithuania

Abstract

The luminescent properties of epitaxial Cu2O thin films were studied in 10–300 K temperature range and compared with the luminescent properties of Cu2O single crystals. Cu2O thin films were deposited epitaxially via the electrodeposition method on either Cu or Ag substrates at different processing parameters, which determined the epitaxial orientation relationships. Cu2O (100) and (111) single crystal samples were cut from a crystal rod grown using the floating zone method. Luminescence spectra of thin films contain the same emission bands as single crystals around 720, 810 and 910 nm, characterizing VO2+, VO+ and VCu defects, correspondingly. Additional emission bands, whose origin is under discussion, are observed around 650–680 nm, while the exciton features are negligibly small. The relative mutual contribution of the emission bands varies depending on the thin film sample. The existence of the domains of crystallites with different orientations determines the polarization of luminescence. The PL of both Cu2O thin films and single crystals is characterized by negative thermal quenching in the low-temperature region; the reason of this phenomenon is discussed.

Publisher

MDPI AG

Subject

General Materials Science

Reference59 articles.

1. Joint Committee on Powder Diffraction Standards (1974). American Society for Testing and Materials Selected Powder Diffraction Data for Minerals: Data Book, Joint Committee on Powder Diffraction Standards. Set 1-5 (Revised), File 5-0667.

2. Origins of the p-type nature and cation deficiency in Cu2O and related materials;Raebiger;Phys. Rev. B,2007

3. Analysis of the conduction mechanism and copper vacancy density in p-type Cu2O thin films;Han;Sci. Rep.,2017

4. Hydrogen-Like Absorption Spectrum of Cuprous Oxide;Hayashi;J. Phys. Soc. Jpn.,1952

5. Engineering of optically defect free Cu2O enabling exciton luminescence at room temperature;Li;Opt. Mater. Express,2013

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3