Secondary ion and laser ablation mass spectrometry for the quantitative characterization of styrene-butadiene copolymers
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference21 articles.
1. Molecular Weight Effects on Polystyrene Fingerprint Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Spectra
2. Time-of-flight secondary ion mass spectrometry of polybutadienes
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4. Speciation analysis of oxides with static secondary ion mass spectrometry
5. Quantitative surface characterization of poly(styrene)/poly(4-vinyl phenol) random and block copolymers by ToF-SIMS and XPS
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