Low Energy Ion Scattering and Secondary Ion Mass Spectrometry-Reference-Cited by-同舟云学术

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Low Energy Ion Scattering and Secondary Ion Mass Spectrometry

Published:2012-04-10 Issue: Volume: Page:453-510
ISSN:
Container-title:Characterization of Solid Materials and Heterogeneous Catalysts
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Author:

Kruse Norbert,Chenakin Sergey

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Reference160 articles.

1. Rays of positive electricity;Thomson;Philos. Mag., Ser. 6,1910

2. Ionization by positive rays;Campbell;Philos. Mag., Ser. 6,1915

3. The formation of negative ions by positive-ion impact on surfaces;Sloane;Proc. R. Soc. London, Ser. A,1938

4. The secondary emission from a nickel surface due to slow positive ion bombardment;Klein;Phys. Rev.,1925

5. The reflection of positive rays by a platinum surface;Read;Phys. Rev.,1928

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ChemInform Abstract: Low Energy Ion Scattering and Secondary Ion Mass Spectrometry;ChemInform;2012-11-29

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