Spectroscopic Ellipsometry-Reference-Cited by-同舟云学术

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Spectroscopic Ellipsometry

Published:2016-07-22 Issue: Volume: Page:215-256
ISSN:
Container-title:Advanced Characterization Techniques for Thin Film Solar Cells
language:
Short-container-title:

Author:

Li Jian¹,Collins Robert W.¹,Sestak Michelle N.¹,Koirala Prakash¹,Podraza Nikolas J.¹,Marsillac Sylvain²,Rockett Angus A.³

Affiliation:

1. University of Toledo; Department of Physics & Astronomy and Wright Center for Photovoltaics Innovation & Commercialization (PVIC); 2801 West Bancroft Street Toledo, OH 43606 USA

2. Old Dominion University; Electrical and Computer Engineering; 231 Kaufman Hall Norfolk, VA 23529 USA

3. University of Illinois; Department of Materials Science and Engineering; 1304 W. Green Street Urbana, IL 61801 USA

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/9783527699025.ch9/fullpdf

Reference63 articles.

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. N-type H2-doped amorphous silicon layer for solar-cell application;Materials for Renewable and Sustainable Energy;2023-04-12

2. Real Time Measurement, Monitoring, and Control of CuIn1−xGaxSe2 by Spectroscopic Ellipsometry;Spectroscopic Ellipsometry for Photovoltaics;2018

3. Optical Simulation of External Quantum Efficiency Spectra;Spectroscopic Ellipsometry for Photovoltaics;2018

4. Use of Rayleigh‐Rice Theory for Analysis of Ellipsometry Data on Rough CIGS Films;physica status solidi c;2017-11-24

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