34.3: High Resolution and High Speed Inspection Equipment for Mini‐LED Substrates-Reference-Cited by-同舟云学术

34.3: High Resolution and High Speed Inspection Equipment for Mini‐LED Substrates

Published:2022-10 Issue:S1 Volume:53 Page:363-366
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:Symp Digest of Tech Papers

Author:

Yasuda Toshiro¹,Kobayashi Kazuhisa¹,Yamamoto Yuichi¹,Hamori Hiroshi¹,Cheng Wei²,Ge Ryan³,Sugawa Shigetoshi⁴

Affiliation:

1. OHT Inc. Fukuyama Japan

2. COHT Inc. Shanghai China

3. Shenzhen Nanovision Corporation Shenzhen China

4. New Industry Creation Hatchery Center Tohoku University Sendai Japan

Publisher

Wiley

Subject

General Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sdtp.15949

Reference5 articles.

1. Mini-LED, Micro-LED and OLED displays: Present status and future perspectives;Huang Y;Light: Science & Applications,2020

2. A system for the automatic visual inspection of bare-printed circuit boards;West G A W;IEEE transactions on systems, man, and cybernetics,1984

3. Circuit board inspection equipment;Ogata H;Japanese Patent P2003-222649A

4. High Accuracy High Spatial Resolution and Real-Time CMOS Proximity Capacitance Image Sensor Technology and its Applications;Kuroda R;ITE Trans. on MTA,2021

5. High Resolution Array Tester for Flat Panel Display Using Proximity Capacitance Image Sensor;Yasuda T;Proceeding of IDW’21,2021

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