Stopping powers and inelastic mean free path from quantitative analysis of experimental REELS spectra for electrons in Ti, Fe, Ni, and Pd

Author:

Suryani Sri1,Heryanto 1,Tahir Dahlang1ORCID

Affiliation:

1. Physics DepartmentHasanuddin University Makassar Indonesia

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference36 articles.

1. Model for quantitative analysis of reflection-electron-energy-loss spectra

2. Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence

3. TougaardS YuberoF.QUEELS‐ε (k ω)‐REELS: software package for quantitative analysis of electron energy loss spectra; dielectric function determined by reflection electron energy loss spectroscopy. Version 3.02.http://www.quases.com.2008.

4. Electronic and optical properties of La-aluminate dielectric thin films on Si (100)

5. Electronic and optical properties of Al2O3/SiO2thin films grown on Si substrate

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