Evaluation of stress gradients ??ij(z) from their discrete laplace transforms ??ij(τk) obtained by x-ray diffraction performed in the scattered vector mode-Reference-Cited by-同舟云学术

Evaluation of stress gradients ??ij(z) from their discrete laplace transforms ??ij(τk) obtained by x-ray diffraction performed in the scattered vector mode

Published:1996-08-16 Issue:2 Volume:156 Page:353-363
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:en
Short-container-title:Phys. Stat. Sol. (a)

Author:

Genzel Ch.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Röntgenstrahlinterferenzen, Akademische Verlagsgesellschaft, Frankfurt (Main) 1960.

2. A Useful Guide for X-Ray Stress Evaluation (XSE)

3. σxx(z) andσyy(z) stress-fields calculated from diffraction experiments performed with synchrotron radiation in theΩ- andΨ-mode techniques

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