Surface Roughness of Porous Materials and Its Characterization by X-Ray Absorption Measurements-Reference-Cited by-同舟云学术

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Surface Roughness of Porous Materials and Its Characterization by X-Ray Absorption Measurements

Published:1992-07-16 Issue:1 Volume:132 Page:103-114
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Hermann H.,Pitschke W.,Mattern N.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. Fractal analysis of surface geometry effects on catalytic reactions

2. Optical properties of microrough metal surfaces

3. Crossover scaling of rough surfaces: effects of surface diffusion with threshold

4. Determination of nanometer structures and surface roughness of polished Si wafers by scanning tunneling microscopy

5. Fractal analysis of crystalline surfaces at atomic resolution

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1. Use of a porous membrane for gas bubble removal in microfluidic channels: physical mechanisms and design criteria;Microfluidics and Nanofluidics;2010-03-24

2. Cation Ordering, Domain Growth, and Zinc Loss in the Microwave Dielectric Oxide Ba3ZnTa2O9-δ;Chemistry of Materials;2003-01-01

3. Surface roughness characterisation of multilayer polymer films for graphic arts applications;Applied Surface Science;2001-04

4. Absorption Corrections of Powder Diffraction Intensities Recorded in Transmission Geometry;Journal of Applied Crystallography;1996-10-01

5. Microabsorption of X-ray Intensity in Fractal Microstructures;Journal of Applied Crystallography;1995-12-01

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